| @Žå—v‹@Ší@Main Facilities |
| ˆê”Ê‰È–Ú Department of General Education |
LLƒVƒXƒeƒ€ | Language Laboratory System |
| ”ä”M‘ª’è‘•’u | Differential Scanning Calorimeter | |
| ƒKƒXƒNƒƒ}ƒgƒOƒ‰ƒt | Gass-chromatograph Spectrometer | |
| ‹@ŠBHŠw‰È Department of Mechanical Engineering |
’´‰¹”g—¬‘¬‘ª’è‘•’u | Ultrasonic Velocity Meter |
| ”Mü—¬‘¬ˆ—‘•’u | Hot Wire Anemometry System | |
| ƒ‚[ƒ_ƒ‹‰ðÍ‘•’u | Modal Analysis Equipment | |
| ”’l§ŒäHì‹@ŠB | Numerical Control Machines | |
| ƒAƒiƒƒOŽžŒn—ñPIVƒVƒXƒeƒ€ | Analogic Time Elapsing PIV System | |
| ’´‚‘¬“xŽB‰e‰ð̓VƒXƒeƒ€ | Ultra High-Speed Recording System | |
| “d‹C“dŽqHŠw‰È Department of Electrical and Electronic Engineering |
ƒCƒ“ƒpƒ‹ƒXƒWƒFƒlƒŒ[ƒ^[ | Impulse Generator |
| ƒvƒ‰ƒYƒ}CVD | Plasma CVD (Chemical Vapor Deposition) | |
| UNIXƒ[ƒNƒXƒe[ƒVƒ‡ƒ“ | UNIX Workstation | |
| “dŽq‰ñ˜HÝŒvƒVƒXƒeƒ€ | Electrical-Circuit Design System | |
| ƒvƒƒOƒ‰ƒ}ƒuƒ‹ƒRƒ“ƒgƒ[ƒ‹ŽÀK‘•’u | Programable Control | |
| ƒ}ƒCƒNƒ”gƒlƒbƒgƒ[ƒNƒAƒiƒ‰ƒCƒU[ | Microwave Network Analyzer | |
| ‘å‹K–ÍWωñ˜HÝŒvŽx‰‡ƒVƒXƒeƒ€ | VLSI CAD System | |
| “dŽqî•ñHŠw‰È Department of Electronic and Information Engineering |
Œõ’ÊMŠî‘bŽÀŒ±‘•’u | Measurement System for Optical Communication |
| UNIXƒ[ƒNƒXƒe[ƒVƒ‡ƒ“ | UNIX Workstation | |
| ‹³ˆç—pŒvŽZ‹@ƒVƒXƒeƒ€ | Computer System for Education | |
| ƒvƒ‰ƒYƒ}ƒvƒƒZƒbƒVƒ“ƒO‘•’u | Plasma Processing Device | |
| Žld‹ÉŽ¿—Ê•ªÍŒv | Quadrupole Mass Analyzer | |
| lH’m”\ƒƒ{ƒbƒg | AI Robot | |
| “dŽq§ŒäŽÀŒ±ƒVƒXƒeƒ€ | Electronic Control Laboratory System | |
| ¶•¨‰ž—p‰»Šw‰È Department of Chemistry and Biochemistry |
400MHzŠjŽ¥‹C‹¤–‘•’u | 400MHz NMR Spectrometer |
| GC|Ž¿—Ê•ªÍŒv | GC-Mass Spectrometer | |
| ICP|”Œõ•ªÍ‘•’u | ICP-Sequential Spectrometer | |
| ŒvŽZ‰»ŠwŽÀŒ±ƒVƒXƒeƒ€ | Computer-Based Molecular Modeling System | |
| ŒuŒõ‚wüŒ³‘f•ªÍ‘•’u | X-ray Fluorescence Spectrometer | |
| y‘f•WޝŒÅ‘Š–Æ‰u‘ª’è‘•’u | ELISA Reader | |
| ’á‰·Žºi4Žj | Cold Room | |
| Þ—¿HŠw‰È Department of Materials Science and Engineering |
ƒCƒ“ƒXƒgƒƒ“Ž®Þ—¿ŽŽŒ±‘•’u | Instron-type Tensile Strength Tester |
| ‚wü‰ñÜ‘•’u | X-Ray Diffractmeter | |
| ”M•ªÍ‘•’u | Thermal Analyzer | |
| ÔŠOü‰Á”MŽ®“d‹C’ïR‘ª’è‘•’u | Instrument for Electrical Resistivity Measurement | |
| ‘SŽ©“®•ª‹É‘ª’è‘•’u | Polarization Analyzer | |
| êU‰È Advanced Engineering Faculty |
SCS-VSAT‹ÇÝ”õ | SCS-VSAT Equipment |
| ƒNƒŠ[ƒ“ƒxƒ“ƒ` | Clean-Bench Type Fume Hoods | |
| ƒhƒ‰ƒtƒgƒ`ƒƒƒ“ƒo[ | Fume Hoods | |
| î•ñˆ—‹³ˆçƒZƒ“ƒ^[ Education Center for Information Processing |
‹³ˆç—p“dŽqŒvŽZ‹@ƒVƒXƒeƒ€ | Computer System for Training |
| ATMƒlƒbƒgƒ[ƒN‘•’u | ATM Network Equipment | |
| ‘åŒ^ˆóü‹@ | Large Printer | |
| ‚‘¬ƒhƒLƒ…ƒƒ“ƒgƒXƒLƒƒƒi | High-Speed Scanner for Documents | |
| “®‰æ‘œˆ—ƒVƒXƒeƒ€ | Image Processing System | |
| ƒ}[ƒNƒV[ƒgˆ—ƒVƒXƒeƒ€ | Computerized Marking Sheet Processing System | |
| ƒT[ƒoƒRƒ“ƒsƒ…[ƒ^ | Server | |
| ŽÀKHê Training Factory |
NCù”Õ | Numerical Control Lathe |
| NCƒtƒ‰ƒCƒX”Õ | Numerical Control Milling Machine | |
| CNCƒhƒŠƒ‹ƒ}ƒVƒ“ | CNC Drilling Machine | |
| Œ¤í”Õ | Grinding Machine | |
| Œ`í”Õ | Shaper | |
| ‚Žü”g—U“±˜F | High-Frequency Induction Furnace | |
| Þ—¿•ªÍŽº Material Analysis Laboratory |
”MŠÔ“™•ûˆ³‰Áˆ³‘•’u | HIP(Hot Isostatic Pressing) |
| —âŠÔ“™•ûˆ³‰Áˆ³‘•’u | CIP(Cold Isostatic Pressing) | |
| “dŠE•úŽËŒ^‘–¸“dŽqŒ°”÷‹¾ | FE-SEM(Field Emission-Type Scanning Electron Microscope) | |
| ƒGƒlƒ‹ƒM[•ªŽUŒ^‚wü•ªŒõ‘•’u | EDS(Energy Dispersive X-Ray Spectroscope) | |
| ‰æ‘œˆ—‰ðÍ‘•’u | Image Analyzer | |
| ‚wüŒõ“dŽq•ªŒõ‘•’u | ESCA(Electron Spectroscopy for Chemical Analysis) | |
| Ž‹’®ŠoŽº Audiovisual Room |
ƒrƒfƒIƒVƒXƒeƒ€@1Ž® | Video Systems one set |
| ƒrƒfƒIƒvƒƒWƒFƒNƒ^[(70ƒCƒ“ƒ`) @2‘ä | Video Projector(70 inches) 2 | |
| AV§ŒäƒVƒXƒeƒ€(‰ñü§Œä‘•’u‚ðŠÜ‚Þ)@1Ž® | AV Control System (including network controlling device) one set |